Sound Meter ? SPL Meter, DB Meter 2.1.1 APK [Ad-free] [Full]
A new dimension of expression is available with the Accel pedal, which enables control of multiple parameters simultaneously, as well as time-variant effects such as Feedbacker, S-Bend, Twist, and more. Experiment with creative combinations of parameters and bring dynamic new sounds to your performances by interacting in real time with this cool pedal.
Sound Meter – SPL meter, dB meter 2.1.1 APK [Ad-free] [Full]
De-crackle is created to remove any continuous set of clicks or noise in an audio signal, with parameters like Quality (low, medium, and high), Strength, and Amplitude skew. The plugin is easy to use, with a click of a few buttons and can help you free your audio of any crackle noise/sounds.
While recording vocals, you may capture clicks and lip smacks in the audio. The RX module has a plugin for getting rid of those sounds, called the Mouth De-click, and has only three parameters and an easy workflow to work with it.
The RX Breadth Control is a smart plugin for detecting and removing breadth sounds from dialogues or vocal performances. It saves you time and effort manually looking for breadth and cleaning them. It does that in a very clicks, with only two parameters: Gain and Sensitivity, by which you can control the sound.
A complete VST plugin for the human voice is called Speaky. Carefully crafted for live streaming, podcasting, content producers, and voiceovers alike, it eliminates the majority of unnecessary parameters for quick and simple setup, even for those with little to no experience with sound engineering.
WLM Plus is an all-in-one solution for measuring, metering, and correcting loudness for all different platforms. It has a level warning feature, extended short-term, long-term, and peak readings, and is fully compliant with all EBU, ITU, and ATSC specs.
In the vast majority of publications, the most relevant instrumental parameters applied for the measurement of an electron micrograph are specified. These are: beam acceleration voltage, pixel size and pixel number, area of the field-of-view, type of detector, working distance, type of cathode and model of microscope and the type of sample preparation. Other parameters like acquisition time or beam current, sometimes decisive for the accurate visualization of sensitive nanoobjects, are mostly not specified. Beam damage and contamination are often encountered issues at the analysis of nanoparticles. The set of full meta data for SEM micrographs as to be saved in a standardized unique format is in an advanced phase of development at ISO (ISO/FDIS 20171) . Of particular importance for metrological dimensional measurements of nanoparticles by electron microscopy, the traceable calibration of the pixel size should be a requirement in any laboratory. Usually, in accredited laboratories, the calibration state of the electron microscope at well-defined acquisition conditions, i.e., the so-called calibration of image magnification, is performed regularly according to the ISO standard ISO 16700:2016  based on a reference to certified reference materials. The evaluation of the resolution of an SEM is specified in ISO/TS 24597:2011 . Another standardization project addressing more criteria for a complete qualification of a SEM for quantitative measurements is in progress at ISO (ISO/PRF TS 21383) .
Input parameters for SESSA (simulation of electron spectra for surface analysis version 2.1.1) by the National Institute of Standards and Technology (NIST), Standard Reference Database Program SRD 100. The manual is available free of charge from: -2017. 350c69d7ab